X-ray Fluorescence Spectrometer DXRF-ED36

DXRF-ED36 X-Ray Fluorescence Spectrometer is an all-in-one XRF capable of virtually any elemental application. DXRF-ED36 comes standard with best in class UHRD or SDD detector and advanced vacuum system and can be used for multiple testing types including Mineral, Alloy, RoHS, Plating Thickness and custom applications.

Features

  • High-performance electronic cooling UHRD detector or Silicon Drift SDD Detector- Application specific
  • Automatic collimators and filters
  • Built-in SNE (Signal to Noise Enhancer)
  • Intelligent RoHS analytical software
  • Multiple Software options
  • Advanced Vacuum System
  • Excellent light elements identification- Al, Cl, Br

Software Options

  • Full-elemental analysis- Na-U
  • RoHS/WEEE Analysis
  • Mineral Analysis
  • Alloy Analysis
  • Plating Thickness
  • Custom calibrations for virtually any application

Standard Configuration

  • Efficient super-thin window x-ray light tube
  • High-performance electronic cooling UHRD detector
  • Signal-to-Noise Enhancer(SNE)
  • CMOS HD camera
  • Automatic Collimators and filters
  • Triple X-Ray protection
  • Vacuum Pump

Specification :

Power: 200W

Voltage input: AC 220V (Optional: 110V)

Ambient humidity: 35%-70%

Instrument dimension: 660mmx510mmx350mm

Ambient temperature: 15°C-30°C

Sample chamber size: 320mmx100mm

Weight: 65K

Specifications

Measurable range: Na to U

Analytical range: ppm-99.99%

Simultaneous analysis: 20 plus elements

Precision: 0.05% (content 96% T )

Testing time: 60s-200s

Resolution: (140±5)eV

Tube voltage: 5KV-50KV

Tube current: 50 uA-1000 11 A

SKU: DXRF-ED36 Category: Tag:
Description

High-Precision Elemental Analysis with the X-ray Fluorescence Spectrometer DXRF-ED36

Achieve reliable, non-destructive quantitative and qualitative elemental analysis with the X-ray Fluorescence Spectrometer DXRF-ED36—a benchtop energy-dispersive XRF (ED-XRF) system engineered for mining, cement, petroleum, environmental, and metallurgical laboratories. Capable of analyzing elements from sodium (Na, 11) to uranium (U, 92) in solids, powders, filters, and liquids, the DXRF-ED36 delivers lab-grade accuracy with minimal sample preparation, supporting compliance with ISO 2267, ASTM D4294, GB/T, and EPA methods.

Engineered for Accuracy, Stability, and Routine Laboratory Use

The DXRF-ED36 X-ray Fluorescence Spectrometer features a high-resolution silicon drift detector (SDD), a 40 kV/100 µA X-ray tube with multiple anode options (Ag, Rh, Cr), and a precision 6-position auto-sampler for unattended batch analysis. Its vacuum and helium purge capabilities enhance detection of light elements (Na, Mg, Al, Si, P, S), while advanced fundamental parameters (FP) and empirical calibration software ensure accurate quantification across diverse sample types—from ores and alloys to oils and soils.

  • Elemental Range: Na (11) to U (92) – Full light-to-heavy element coverage with vacuum/helium modes.
  • Detection Limits: 1–10 ppm (matrix-dependent) – Suitable for trace metal analysis in lubricants, catalysts, and environmental samples.
  • 6-Position Auto-Sampler – Enables high-throughput, unattended operation for routine QC labs.
  • Pre-Loaded Calibration Packages – Includes Mining, Cement, Petroleum, RoHS, and Alloy libraries; user-calibratable.
  • Compliance-Ready Software – Stores full audit trails, supports user access levels, and exports reports in PDF/CSV.
  • Compact Benchtop Design with Safety Interlocks – Fully shielded; complies with IEC 61010 and radiation safety standards.

Trusted in Industrial and Research Laboratories

From determining sulfur content in fuels (ASTM D4294) and monitoring catalyst metals in refineries to quantifying cement raw meal composition or screening electronics for restricted substances, the DXRF-ED36 delivers consistent, reproducible results without acids, digestion, or hazardous waste. Its robust design and intuitive software make it ideal for ISO 17025-accredited labs, quality control departments, and R&D facilities seeking a cost-effective alternative to ICP or AAS.

Whether you’re controlling process chemistry or validating material compliance, the X-ray Fluorescence Spectrometer DXRF-ED36 provides the speed, precision, and reliability your analytical workflow demands.

Non-destructive. Accurate. Built for the modern lab.

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